Sapphire analyzers for high-resolution X-ray spectroscopy

نویسندگان

  • Hasan Yavas
  • Ercan Alp
  • Harald Sinn
  • Ahmet Alatas
  • Ayman H. Said
  • Yuri Shvyd’ko
  • Thomas Toellner
  • Ruben Khachatryan
  • Simon J.L. Billinge
  • M. Zahid Hasan
  • Wolfgang Sturhahn
چکیده

We present a sapphire ðAl2O3Þ analyzer for high-resolution X-ray spectroscopy with 31-meV energy resolution. The analyzer is designed for resonant inelastic X-ray scattering (RIXS) measurements at the CuKa absorption edge near 8990 eV. The performance of the analyzer is demonstrated by measuring phonon excitations in beryllium because of its known dynamical structure and high counting rates. r 2007 Elsevier B.V. All rights reserved. PACS: 07.85.Qe; 07.85.Nc

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تاریخ انتشار 2007