Sapphire analyzers for high-resolution X-ray spectroscopy
نویسندگان
چکیده
We present a sapphire ðAl2O3Þ analyzer for high-resolution X-ray spectroscopy with 31-meV energy resolution. The analyzer is designed for resonant inelastic X-ray scattering (RIXS) measurements at the CuKa absorption edge near 8990 eV. The performance of the analyzer is demonstrated by measuring phonon excitations in beryllium because of its known dynamical structure and high counting rates. r 2007 Elsevier B.V. All rights reserved. PACS: 07.85.Qe; 07.85.Nc
منابع مشابه
Spherical analyzers and monochromators for resonant inelastic hard X-ray scattering: a compilation of crystals and reflections
Resonant inelastic X-ray scattering (RIXS) experiments require special sets of near-backscattering spherical diced analyzers and high-resolution monochromators for every distinct absorption-edge energy and emission line. For the purpose of aiding the design and planning of efficient RIXS experiments, comprehensive lists of suitable analyzer reflections for silicon, germanium, α-quartz, sapphire...
متن کاملNew developments in fabrication of high-energy-resolution analyzers for inelastic X-ray spectroscopy
In this work new improvements related to the fabrication of spherical bent analyzers for 1 meV energy-resolution inelastic X-ray scattering spectroscopy are presented. The new method includes the use of a two-dimensional bender to achieve the required radius of curvature for X-ray analyzers. The advantage of this method is the ability to monitor the focus during bending, which leads to higher-e...
متن کاملMetal organic chemical vapor deposition and investigation of ZnO thin films grown on sapphire
A new type of large area metal organic chemical vapor deposition (MOCVD) system for the growth of high quality and large size ZnO materials is introduced. Materials properties of the un-doped, nand p-doped ZnO epi-films grown on sapphire substrates by this MOCVD system are studied by various techniques, including high resolution X-ray diffraction (XRD), UV–Visible optical transmission (OT), pho...
متن کاملHigh-quality quartz single crystals for high-energy-resolution inelastic X-ray scattering analyzers
Spherical analyzers are well known instruments for inelastic X-ray scattering (IXS) experiments. High-resolution IXS experiments almost always use Si single crystals as monochromators and spherical analyzers. At higher energies (>20 keV) Si shows a high energy resolution (<10 meV), at an exact symmetric back-diffraction condition, since the energy resolution is given by the real part of the sus...
متن کاملGrowth of V2O3 thin films on a-plane (110) and c-plane (001) sapphire via pulsed-laser deposition
We report the direct deposition of epitaxial 215-nm-thick vanadium sesquioxide (V2O3) films on aand c-plane sapphire substrates from powder-pressed V2O3 targets via pulsed-laser deposition (PLD) in an evacuated deposition chamber devoid of O2. The films were characterized using x-ray diffraction (XRD), x-ray photoemission spectroscopy (XPS), x-ray absorption fine structure (XAFS) spectroscopy, ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
عنوان ژورنال:
دوره شماره
صفحات -
تاریخ انتشار 2007